发明名称 |
A SYSTEM CAPABLE OF DETERMINING APPLIED AND ANODIZED COATING THICKNESS OF A COATED-ANODIZED PRODUCT |
摘要 |
A system for forming an anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness. |
申请公布号 |
WO2006074106(A2) |
申请公布日期 |
2006.07.13 |
申请号 |
WO2005US47585 |
申请日期 |
2005.12.30 |
申请人 |
SENSORY ANALYTICS;PRICE, JOSEPH, K. |
发明人 |
PRICE, JOSEPH, K. |
分类号 |
C25D21/12;B05D1/00;G03F7/00;G03F7/26 |
主分类号 |
C25D21/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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