发明名称 INCREASING DOPING OF WELL COMPENSATING DOPANT REGION
摘要 Methods and resulting structure of implementing a compensating implant that creates more compensation doping as the gate length is increased are disclosed. In particular, the invention performs an angled compensation implant through a gate opening during the damascene process such that the compensating dopant concentration increases as the gate length increases. In this fashion, the threshold voltage of a longer device is reduced much more than the threshold voltage of a shorter device, thereby reducing the threshold voltage of the longer device to acceptable levels without affecting the threshold voltage of the shorter device. The invention is especially advantageous relative to super-steep retrograde wells.
申请公布号 US2006154428(A1) 申请公布日期 2006.07.13
申请号 US20050905591 申请日期 2005.01.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 DOKUMACI OMER H.
分类号 H01L29/76;H01L21/336 主分类号 H01L29/76
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