| 摘要 |
A method of examining a sample includes measuring, as function of wavelength of light elastically scattered from the sample, at least 2 properties, selected from the group consisting of scattering angle theta of the light, scattering angle phi of the light, and polarization of the light. The scattering angle theta is an angle between backward direction and direction of propagation of the light, and scattering angle phi is an angle between incident light polarization and projection of direction of the light propagation onto a plane in which incident electric field oscillates. |
