发明名称 ELECTRICALLY ENHANCING THE CONFINEMENT OF PLASMA
摘要 A vacuum plasma processor includes a chamber having a grounded wall and an outlet port. Plasma is excited at a first RF frequency in a chamber region spaced from the wall and outlet port. A structure confines the plasma to the region while enabling gas to flow from the region to the outlet port. RF electric power at a second frequency connected to the confining structure causes the confining structure to be at a potential different from ground to increase the size of a sheath between the plasma and confining structure and increase the confining structure effectiveness. The region includes an electrode connected to ground by a circuit that is series resonant to the first frequency and includes capacitance of the sheath.
申请公布号 WO2006074050(A2) 申请公布日期 2006.07.13
申请号 WO2005US47385 申请日期 2005.12.29
申请人 LAM REASEARCH CORPORATION;KUTHI, ANDRAS;KIM, JISOO;LENZ, ERIC;DHINDSA, RAJINDAR;LI, LUMIN;SADJADI, REZA 发明人 KUTHI, ANDRAS;KIM, JISOO;LENZ, ERIC;DHINDSA, RAJINDAR;LI, LUMIN;SADJADI, REZA
分类号 H01J37/32 主分类号 H01J37/32
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