发明名称 Automatic test pin assignment
摘要 A tool for facilitating automatic test pin assignment for a programmable platform device comprising: a process for collecting information related to the programmable platform device, a process for automatically initializing a test pin assignment for the programmable platform device, a process configured to receive user specifications for IOs and a process for performing dynamic test pin reassignment in response to the user specifications.
申请公布号 US2006156142(A1) 申请公布日期 2006.07.13
申请号 US20040016192 申请日期 2004.12.17
申请人 LSI LOGIC CORPORATION 发明人 GABRIELSON DONALD;YOUNGMAN TODD;NORDMAN JOHN;MINTER MICHAEL A.
分类号 G01R31/28;G06F11/00 主分类号 G01R31/28
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