摘要 |
A method of fabricating a semiconductor device includes a dry etching process of a silicon surface. The dry etching process is conducted by an etching gas containing at least one gas species selected from the group consisting of: HBr, HCl, Cl<SUB>2</SUB>, Br<SUB>2 </SUB>and HI, wherein the dry etching process includes a first step conducted at a first temperature; and a second step conducted at a second temperature.
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