发明名称 Semiconductor device and fabrication process thereof
摘要 A method of fabricating a semiconductor device includes a dry etching process of a silicon surface. The dry etching process is conducted by an etching gas containing at least one gas species selected from the group consisting of: HBr, HCl, Cl<SUB>2</SUB>, Br<SUB>2 </SUB>and HI, wherein the dry etching process includes a first step conducted at a first temperature; and a second step conducted at a second temperature.
申请公布号 US2006154488(A1) 申请公布日期 2006.07.13
申请号 US20050145218 申请日期 2005.06.06
申请人 FUJITSU LIMITED 发明人 MORIOKA HIROSHI
分类号 H01L21/461;H01L21/302;H01L21/336 主分类号 H01L21/461
代理机构 代理人
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