发明名称 HIGH PRECISION VOLTAGE SOURCE FOR ELECTRICAL IMPEDANCE TOMOGRAPHY
摘要 <p>An EIT system includes a plurality of voltage sources for supplying a corresponding plurality of voltages to a corresponding number of other structures, voltage source calibration means for calibrating each voltage source, and switching means for individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition. Calibrating respective voltages and currents for each voltage source compensates for shunt impedance of each voltage source. A method for calibrating the system includes individually connecting the calibration means to each voltage source in succession during a period when each other structure is in an inactive condition for calibrating all of said voltage sources in the same way.</p>
申请公布号 WO2006074092(A1) 申请公布日期 2006.07.13
申请号 WO2005US47477 申请日期 2005.12.30
申请人 RENSSELAER POLYTECHNIC INSTITUTE;SAULNIER, GARY, J.;LIU, NING;ROSS, ALEXANDER, S. 发明人 SAULNIER, GARY, J.;LIU, NING;ROSS, ALEXANDER, S.
分类号 G01R27/08;A61B5/05;G01R31/08;G01R35/00 主分类号 G01R27/08
代理机构 代理人
主权项
地址