发明名称 Printed circuit board inspecting apparatus, inspection logic setting method, and inspection logic setting apparatus
摘要 <p>A technology is provided for automatically producing an inspection logic to be used in the action of inspecting a PC board. An inspection logic setting apparatus (2) is arranged for acquiring a plurality of first images of components to be detected by the inspection and a plurality of second images of components to be rejected by the inspection, dividing each of said plurality of first and second images into the plurality of blocks, calculating a color distance between said plurality of first images and said plurality of second images in said each block, selecting one or more blocks from said plurality of blocks which are relatively greater in the color distance, and assigning said selected block(s) to the area condition.</p>
申请公布号 EP1679520(A1) 申请公布日期 2006.07.12
申请号 EP20060100242 申请日期 2006.01.11
申请人 OMRON CORPORATION 发明人 MORIYA, TOSHIHIRO;WADA, HIROTAKA;ONISHI, TAKAKO;SHIMIZU, ATSUSHI;NAKAJIMA, AKIRA
分类号 G01R31/04;G01N21/956 主分类号 G01R31/04
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