发明名称 |
SONOS memory device having nanocrystal layer |
摘要 |
Provided is a SONOS memory device having nanocrystal layers. The SONOS memory device includes a memory type transistor including a gate with a SONOS structure on a semiconductor substrate. The gate is formed by sequentially stacking a tunneling oxide layer, a memory node layer having a trap site in which charges passing through the tunneling oxide layer are trapped, and a gate electrode. The memory node layer includes a crystal layer composed of nanocrystals that are separated from one another to trap the charges. |
申请公布号 |
EP1480275(A3) |
申请公布日期 |
2006.07.12 |
申请号 |
EP20040252910 |
申请日期 |
2004.05.19 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, JU-HYUNG;KIM, CHUNG-WOO;CHAE, SOO-DOO;JEONG, YOUN-SEOK |
分类号 |
H01L21/8247;H01L29/792;H01L21/28;H01L27/108;H01L27/115;H01L29/423;H01L29/51;H01L29/788 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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