发明名称 SONOS memory device having nanocrystal layer
摘要 Provided is a SONOS memory device having nanocrystal layers. The SONOS memory device includes a memory type transistor including a gate with a SONOS structure on a semiconductor substrate. The gate is formed by sequentially stacking a tunneling oxide layer, a memory node layer having a trap site in which charges passing through the tunneling oxide layer are trapped, and a gate electrode. The memory node layer includes a crystal layer composed of nanocrystals that are separated from one another to trap the charges.
申请公布号 EP1480275(A3) 申请公布日期 2006.07.12
申请号 EP20040252910 申请日期 2004.05.19
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, JU-HYUNG;KIM, CHUNG-WOO;CHAE, SOO-DOO;JEONG, YOUN-SEOK
分类号 H01L21/8247;H01L29/792;H01L21/28;H01L27/108;H01L27/115;H01L29/423;H01L29/51;H01L29/788 主分类号 H01L21/8247
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