| 发明名称 |
Photothermal imaging scanning microscopy |
| 摘要 |
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.
|
| 申请公布号 |
US7075058(B2) |
申请公布日期 |
2006.07.11 |
| 申请号 |
US20030402604 |
申请日期 |
2003.03.28 |
| 申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY |
发明人 |
CHINN DIANE;STOLZ CHRISTOPHER J.;WU ZHOULING;HUBER ROBERT;WEINZAPFEL CAROLYN |
| 分类号 |
G01N21/41;G01N21/17;G01N25/72;G01Q30/04 |
主分类号 |
G01N21/41 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
|
| 地址 |
|
