发明名称 Doping-assisted defect control in compound semiconductors
摘要 The present invention relates to the production of thin film epilayers of III-V and other compounds with acceptor doping wherein the acceptor thermally stabilizes the epilayer, stabilize the naturally incorporated native defect population and therewith maintain the epilayer's beneficial properties upon annealing among other advantageous effects. In particular, balanced doping in which the acceptor concentration is similar to (but does not exceed) the antisite defects in the as-grown material is shown to be particularly advantageous in providing thermal stability, high resistivity and ultrashort trapping times. In particular, MBE growth of LT-GaAs epilayers with balanced Be doping is described in detail. The growth conditions greatly enhance the materials reproducibility (that is, the yield in processed devices). Such growth techniques can be transferred to other III-V materials if the growth conditions are accurately reproduced. Materials produced herein also demonstrate advantages in reproducibility, reliability and radiation hardening.
申请公布号 US7074697(B2) 申请公布日期 2006.07.11
申请号 US20030706610 申请日期 2003.11.12
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 SPECHT PETRA;WEBER EICKE R.;WEATHERFORD TODD RUSSELL
分类号 H01L21/20;C30B23/02;C30B29/42;H01L21/203 主分类号 H01L21/20
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