发明名称 Bump formed on semiconductor device chip and method for manufacturing the bump
摘要 A bump of a semiconductor chip comprises a plurality of bond pads formed on a semiconductor chip, a conductive bump formed on the bond pads; and a sidewall insulating layer formed on sidewalls of the conductive bump. It is possible for the semiconductor chip to prevent electrical shorts and improve productivity even though a pitch of bond pad is decreased.
申请公布号 US7074704(B2) 申请公布日期 2006.07.11
申请号 US20040860536 申请日期 2004.06.02
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON YONG-HWAN;KANG SA-YOON
分类号 H01L21/44;H01L21/60;H01L23/485;H01L23/52 主分类号 H01L21/44
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