| 摘要 |
A system ( 20 ) and method to locate an anomaly ( 22 ) of a conductor ( 24 ) is provided. The system ( 20 ) uses a test set ( 28 ) to inject a test signal ( 36 ) into the conductor ( 24 ) at a location (P<SUB>T</SUB>) and a probe ( 30 ) to detect the test signal ( 36 ) at a second location (P<SUB>P</SUB>). A communication link ( 42 ) between the probe ( 30 ) and the test set ( 28 ) has a predetermined propagation delay (D<SUB>S</SUB>), from which the system ( 20 ) can calculate a propagation delay (D<SUB>TP</SUB>) of the conductor ( 24 ) between the test set ( 28 ) and the probe ( 30 ), and a propagation delay (D<SUB>PA</SUB>) between the probe ( 30 ) and the anomaly ( 22 ). By varying the location (P<SUB>P</SUB>) of the probe ( 30 ) until the propagation delay (D<SUB>PA</SUB>) between the probe ( 30 ) and the anomaly ( 22 ) is substantially zero, the precise location (P<SUB>A</SUB>) of the anomaly ( 22 ) may be determined. The propagation velocity (V<SUB>C</SUB>) of the conductor ( 24 ) may also be determined. The physical distance (L<SUB>PA</SUB>) between the probe ( 30 ) and the anomaly ( 22 ), and hence the precise location (P<SUB>A</SUB>) of the anomaly ( 22 ), again may be determined.
|
