发明名称 Self aligned method of forming a semiconductor memory array of floating gate memory cells with buried bit-line and vertical word line transistor
摘要 A self aligned method of forming a semiconductor memory array of floating gate memory cells in a semiconductor substrate, and an array formed thereby, whereby each memory cell includes a trench formed into a surface of a semiconductor substrate, spaced apart source and drain regions with a channel region formed therebetween. The drain region is formed underneath the trench, and the channel region includes a first portion that extends substantially vertically along a sidewall of the trench and a second portion that extends substantially horizontally along the surface of the substrate. An electrically conductive floating gate is formed over and insulated from at least a portion of the channel region and a portion of the source region. An electrically conductive control gate is formed having a first portion disposed in the trench and a second portion formed over but insulated from the floating gate.
申请公布号 US7074672(B2) 申请公布日期 2006.07.11
申请号 US20040776397 申请日期 2004.02.10
申请人 SILICON STORAGE TECHNOLOGY, INC. 发明人 KIANIAN SOHRAB;WANG CHIH HSIN
分类号 H01L21/336;H01L21/8247;H01L27/115;H01L29/423;H01L29/788 主分类号 H01L21/336
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