发明名称 Generating a test sequence using a satisfiability technique
摘要 Generating a test sequence includes receiving a circuit representation describing a circuit, and a fault associated with the circuit representation. A miter circuit model associated with a good circuit model and a faulty circuit model is established according to the circuit representation. A satisfiability problem corresponding to the fault as associated with the miter circuit model is also established. Whether the satisfiability problem is satisfiable is determined. If the satisfiability problem is satisfiable, a test sequence is generated for the fault as associated with the miter circuit model.
申请公布号 US7076712(B2) 申请公布日期 2006.07.11
申请号 US20030444483 申请日期 2003.05.22
申请人 FUJITSU LIMITED 发明人 PRASAD MUKUL R.;HSIAO MICHAEL S.;JAIN JAWAHAR
分类号 G06F11/00;G01R31/3183;G01R31/3185 主分类号 G06F11/00
代理机构 代理人
主权项
地址