发明名称 Method for CuO reduction by using two step nitrogen oxygen and reducing plasma treatment
摘要 A method for cleaning a copper interconnect after a chemical-mechanical polishing that comprises: a) treating the surface of said copper interconnect with a nitrogen and oxygen containing treatment; and b) without breaking vacuum, treating the copper interconnect with a NH<SUB>3 </SUB>or H<SUB>2 </SUB>plasma treatment. Next a cap layer is formed over the copper interconnect.
申请公布号 US2006148255(A1) 申请公布日期 2006.07.06
申请号 US20050029881 申请日期 2005.01.05
申请人 LU WEI;GOH LOH NAH L;HSIA LIANG C 发明人 LU WEI;GOH LOH NAH L.;HSIA LIANG C.
分类号 H01L21/44;H01L21/26;H01L21/461 主分类号 H01L21/44
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