发明名称 PLASMA PROCESSING APPARATUS
摘要 <p>A dry etching apparatus (11) is provided with a vacuum container (12) wherein an object (1) to be processed is arranged on a bottom wall side in an internal space (15); a plasma generating coil (36), which is arranged on an outer side upper part of the vacuum container (12) and is provided with a conductor (37) arranged to form a space (39A) in a plane view; a top wall (16), which closes an upper part of the internal space (15) and is provided with a transparent section (30) at a position corresponding to the space (39A) between the conductors (37) of the coil (36) in the plane view; and a camera (45), which is arranged at the upper part of the coil (36) and includes at least a part of the object in a view field through the space (39A) and the transparent section (30). The status of the object during plasma processing can be observed in real time.</p>
申请公布号 WO2006070564(A1) 申请公布日期 2006.07.06
申请号 WO2005JP22353 申请日期 2005.12.06
申请人 MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.;HIROSHIMA, MITSURU;MIYAKE, SUMIO;OKUNE, MITSUHIRO;WATANABE, SHOZOH;SUZUKI, HIROYUKI 发明人 HIROSHIMA, MITSURU;MIYAKE, SUMIO;OKUNE, MITSUHIRO;WATANABE, SHOZOH;SUZUKI, HIROYUKI
分类号 H01L21/3065;H01L21/205 主分类号 H01L21/3065
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