发明名称 Analog base-band test apparatus and method by enhanced combination of JTAG and memory in mobile communication system
摘要 An analog base-band (ABB) chipset of a mobile communication system comprises a memory configured to store a test pattern, a test control unit configured to generate a control signal during a test mode, an ABB unit configured to perform a test operation by receiving the test pattern from the memory in response to the test control signal and to output data of the test pattern to the memory in response to the test control signal, and a path selection circuit configured to form a flow path of the test pattern in the ABB unit in response to the test control signal.
申请公布号 US2006150038(A1) 申请公布日期 2006.07.06
申请号 US20060324707 申请日期 2006.01.03
申请人 SAMSUNG ELECTRONICS CO., LTD 发明人 YOON SEONG-HO
分类号 G01R31/28 主分类号 G01R31/28
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