首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD FOR REDUCING CONTACT RESISTANCE BETWEEN TUNGSTEN PLUG AND COPPER INTERCONNECT
摘要
申请公布号
KR20060079318(A)
申请公布日期
2006.07.06
申请号
KR20040117084
申请日期
2004.12.30
申请人
MAGNACHIP SEMICONDUCTOR, LTD.
发明人
KIM, DONG JOON
分类号
H01L21/28
主分类号
H01L21/28
代理机构
代理人
主权项
地址
您可能感兴趣的专利
METHOD FOR PRODUCING A LAMINATE
OPTICAL PACKAGE
SWITCHING POWER SUPPLY
HIGH FREQUENCY WAVE AND SURGE ABSORBING FILTER
ESTIMATION PROCESSING SYSTEM FOR SYSTEM PERFORMANCE
Switchable and adjustable thread tensioner
Process for the production of mouldings, films or sheets
Heating arrangement with draught-regulating device
High-pressure accumulator for hydraulic systems
Process for mounting a tension member which runs in a freely stressed manner between its anchorage points, in particular a stay cable for a cable-stayed bridge
Joint band for a building joint
Fluid reservoir for a hydraulic brake system
Fast canoe carrier
Process for preparing cellulose fibres and a filter containing these
Apparatus for atomic absorbtion spectroscopy
Amunition container
Mixer for concrete mixing machines
Multifunctional closure
Inductive unit for detecting metal parts
Compound link rear axle