发明名称 Method for forming shallow trench isolation with rounded corners by using a clean process
摘要 In a method for forming STI in a silicon substrate having a pad oxide over the substrate, a hard mask is formed over the pad oxide, the hard mask and the pad oxide are patterned to form an opening, the silicon substrate is etched through the opening to form a trench, a liner oxide is formed over the trench, an STI insulator is formed in the trench, and the hard mask and the pad oxide are removed. Before the formation of the liner oxide, a clean process is performed that comprises applying silicon-consuming solution to round the top corners of the trench.
申请公布号 US2006148197(A1) 申请公布日期 2006.07.06
申请号 US20050134372 申请日期 2005.05.23
申请人 WU CHIA-WEI;CHEN CHENG-SHUN;HSIEH JUNG-YU;YANG LING W 发明人 WU CHIA-WEI;CHEN CHENG-SHUN;HSIEH JUNG-YU;YANG LING W.
分类号 H01L21/76;H01L21/302 主分类号 H01L21/76
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