发明名称 ELECTROOPTICAL APPARATUS, TESTING METHOD AND DRIVING DEVICE FOR THE SAME AND ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To improve effectiveness of an inspection result by enabling the inspection after installing a driving device. <P>SOLUTION: A data line driving circuit 200 comprises; m pieces of output terminals Tout, each of which is connected to a data line 103; a signal generation circuit 25 for generating data signals X1 to Xn according to a grayscale indicated for each pixel; and a detection wiring 30 for detecting leak of current in each data line 103, and it operates in a detecting mode or in a driving mode. In the detecting mode, each output terminal Tout is sequentially connected to the detection wiring 30 and a correction data DH corresponding to the current flowing to the detection wiring 30 is generated. On the other hand, in the driving mode, a data signal Xj which is generated for each data line 103 by the signal generation circuit 25 is corrected based on the correction data generated in the detection mode. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006178030(A) 申请公布日期 2006.07.06
申请号 JP20040368859 申请日期 2004.12.21
申请人 SEIKO EPSON CORP 发明人 TSUJI MASUO
分类号 G09G3/30;G01R31/317;G02F1/133;G02F1/136;G09G3/20;H01L51/50;H05B33/12 主分类号 G09G3/30
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