发明名称 |
FORMING METHOD OF GROUNDING LAYER CONSISTING OF GARIUM NITRIDE-BASED COMPOUND SEMICONDUCTOR, AND MANUFACTURING METHOD OF GARIUM NITRIDE-BASED SEMICONDUCTOR LIGHT EMITTING DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method of forming a GaN-based compound semiconductor layer in which a crystal defect density is low and moreover any piezo spontaneous polarization is hard to occur. <P>SOLUTION: The method of forming the GaN system compound semiconductor layer comprises the steps of (A) forming on an R plane of a sapphire substrate 10 a plurality of separate seed layers 11 consisting of a GaN-based compound semiconductor; (B) carrying out from each seed layer 11 a longitudinal direction epitaxial growth of a first GaN system compound semiconductor layer 12, in which a crested plane 12A is an A plane and a side view 12B is a C plane; (C) substantially forming a mask layer 13 at the crested plane 12A of the first GaN-based compound semiconductor layer 12 residing at an upper part of the seed layers 11; and (D) carrying out from the crested plane 12A of the first GaN-based compound semiconductor layer 12 a longitudinal direction epitaxial growth of a second GaN-based compound semiconductor layer 14, in which a crested plane 14A is the A plane and a side 14B is the C plane on the crested plane 12A and the mask layer 13 of the first GaN-based compound semiconductor layer 12. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2006179857(A) |
申请公布日期 |
2006.07.06 |
申请号 |
JP20050230414 |
申请日期 |
2005.08.09 |
申请人 |
SONY CORP |
发明人 |
OKUYAMA HIROYUKI;BIWA TSUYOSHI |
分类号 |
H01L21/205;H01L33/12;H01L33/16;H01L33/32 |
主分类号 |
H01L21/205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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