发明名称 Device and method for measuring thickness
摘要 A device for measuring thickness of an object has a vibration generator for generating vibrations in the object, a vibration detector for detecting vibrations generated in the object by the vibration generator and a frequency analyzer for calculating resonance frequency of the object. The vibration generator includes a light-emitting part which emits light towards the object to irradiate and to be absorbed by the object. A plurality of vibration detectors may be used and the frequency analyzer may include a sound speed analyzer for calculating speed of sound inside the object from vibrations detected by these plurality of vibration detectors.
申请公布号 US2006144147(A1) 申请公布日期 2006.07.06
申请号 US20060368095 申请日期 2006.03.02
申请人 ISHIMARU ICHIRO;OKUDA TAKAHIRO 发明人 ISHIMARU ICHIRO;OKUDA TAKAHIRO
分类号 G01B17/02;G01N3/32;G01B11/06;G01L1/24;G01N29/00 主分类号 G01B17/02
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