发明名称 Stressed field effect transistors on hybrid orientation substrate
摘要 A semiconductor structure having improved carrier mobility is provided. The semiconductor structures includes a hybrid oriented semiconductor substrate having at least two planar surfaces of different crystallographic orientation, and at least one CMOS device located on each of the planar surfaces of different crystallographic orientation, wherein each CMOS device has a stressed channel. The present invention also provides methods of fabricating the same. In general terms, the inventive method includes providing a hybrid oriented substrate having at least two planar surfaces of different crystallographic orientation, and forming at least one CMOS device on each of the planar surfaces of different crystallographic orientation, wherein each CMOS device has a stressed channel.
申请公布号 US2006145264(A1) 申请公布日期 2006.07.06
申请号 US20050029797 申请日期 2005.01.05
申请人 INTERNAIONAL BUSINESS MACHINES CORPORATION 发明人 CHIDAMBARRAO DURESETI;HOLT JUDSON R.;IEONG MEIKEI;OUYANG OIGING C.;PANDA SIDDHARTHA
分类号 H01L29/94;H01L29/76 主分类号 H01L29/94
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