发明名称 SEMICONDUCTOR STRUCTURES UTILIZING THIN FILM RESISTORS AND TUNGSTEN PLUG CONNECTORS AND METHODS FOR MAKING THE SAME
摘要 Semiconductor structures and methods for fabricating semiconductor structures are provided. The method comprises forming a first insulating layer having a substantially planar surface overlying a first conductive layer of an interconnect stack. A thin film resistor is formed overlying the first insulating layer and a second insulating layer is deposited overlying the first insulating layer and the resistor. A portion of the second insulating layer is removed to form a substantially planar surface. The second insulating layer is anisotropically etched to form a first via to the first conductive layer and a fill material comprising tungsten is deposited within the first via. The second insulating layer is wet etched to form a second via to the thin film resistor and a second conductive layer is deposited overlying the second insulating layer and within the second via.
申请公布号 WO2006071617(A2) 申请公布日期 2006.07.06
申请号 WO2005US46056 申请日期 2005.12.20
申请人 MEDTRONIC, INC.;DANZL, RALPH, B. 发明人 DANZL, RALPH, B.
分类号 H01L23/522;H01L21/768 主分类号 H01L23/522
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