发明名称 MANUFACTURING METHOD OF MICROSTRUCTURE
摘要 PROBLEM TO BE SOLVED: To realize a sacrificial layer of silicon oxide film having a large etching rate in a manufacturing process of microstructures. SOLUTION: A plasma space under approximate normal pressure is formed by a pair of electrodes. Mixed gas of TMOS and nitrogen is sprayed to a substrate for microstructures without going through the plasma space, and oxygen is sprayed to the substrate with going through the plasma space to contact with the mixed gas on the substrate. Each gas flow rate is 0.26 g/min for TMOS, 10 slm for nitrogen, and 10 slm for oxygen, and does not contain moisture. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006175583(A) 申请公布日期 2006.07.06
申请号 JP20050314128 申请日期 2005.10.28
申请人 CHEMITORONICS CO LTD;MEMS CORE CO LTD;SEKISUI CHEM CO LTD 发明人 HONMA KOJI;MIYAZAKI MASARU;NAKANO YOSHINORI;ANZAI JUNICHIRO;YUASA MOTOKAZU
分类号 B81C1/00;B81B3/00;C23C16/42;H01L21/3065;H01L21/31;H01L29/84 主分类号 B81C1/00
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