发明名称 |
MANUFACTURING METHOD OF MICROSTRUCTURE |
摘要 |
PROBLEM TO BE SOLVED: To realize a sacrificial layer of silicon oxide film having a large etching rate in a manufacturing process of microstructures. SOLUTION: A plasma space under approximate normal pressure is formed by a pair of electrodes. Mixed gas of TMOS and nitrogen is sprayed to a substrate for microstructures without going through the plasma space, and oxygen is sprayed to the substrate with going through the plasma space to contact with the mixed gas on the substrate. Each gas flow rate is 0.26 g/min for TMOS, 10 slm for nitrogen, and 10 slm for oxygen, and does not contain moisture. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006175583(A) |
申请公布日期 |
2006.07.06 |
申请号 |
JP20050314128 |
申请日期 |
2005.10.28 |
申请人 |
CHEMITORONICS CO LTD;MEMS CORE CO LTD;SEKISUI CHEM CO LTD |
发明人 |
HONMA KOJI;MIYAZAKI MASARU;NAKANO YOSHINORI;ANZAI JUNICHIRO;YUASA MOTOKAZU |
分类号 |
B81C1/00;B81B3/00;C23C16/42;H01L21/3065;H01L21/31;H01L29/84 |
主分类号 |
B81C1/00 |
代理机构 |
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地址 |
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