发明名称 ELECTROOPTICAL APPARATUS, TESTING METHOD AND DRIVING DEVICE FOR SAME AND ELECTRONIC APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To improve effectiveness of an inspection result by enabling the inspection after installing a driving device. <P>SOLUTION: A data line driving circuit 200 comprises; n pieces of output terminals Tout, each of which is connected to a data line 103; a signal generation circuit 25 for generating data signals X1 to Xn according to a grayscale specified for each pixel; a detection wiring 30 for detecting current leak in each data line 103; and n pieces of switching elements 271, each of which is connected to the output terminal Tout. Each switching element 271 outputs the data signals X1 to Xn generated by the signal generation circuit 25 to each output terminal Tout when a driving mode is specified by a mode selection signal Smod, while all the output terminals Tout is made conductive to the detection wiring 30 when a detection mode is specified by the mode selection signal Smod. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006178029(A) 申请公布日期 2006.07.06
申请号 JP20040368858 申请日期 2004.12.21
申请人 SEIKO EPSON CORP 发明人 TSUJI MASUO
分类号 G09G3/30;G01R31/26;G02F1/13;G09G3/20;G09G3/36;H01L51/50;H05B33/12 主分类号 G09G3/30
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