发明名称 |
On-axis electron impact ion source |
摘要 |
An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis (on-axis) to ionize an analyte sample provided to the ionization chamber.
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申请公布号 |
US2006145072(A1) |
申请公布日期 |
2006.07.06 |
申请号 |
US20050271443 |
申请日期 |
2005.11.09 |
申请人 |
WANG MINGDA;CIRIMELE EDWARD C |
发明人 |
WANG MINGDA;CIRIMELE EDWARD C. |
分类号 |
B01D59/44 |
主分类号 |
B01D59/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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