发明名称 On-axis electron impact ion source
摘要 An electron impact ion source includes an ionization chamber in which a first rf multipole field can be generated and an ion guide positioned downstream from the ionization chamber in which a second rf multipole field can be generated wherein electrons are injected into the ionization chamber along the axis (on-axis) to ionize an analyte sample provided to the ionization chamber.
申请公布号 US2006145072(A1) 申请公布日期 2006.07.06
申请号 US20050271443 申请日期 2005.11.09
申请人 WANG MINGDA;CIRIMELE EDWARD C 发明人 WANG MINGDA;CIRIMELE EDWARD C.
分类号 B01D59/44 主分类号 B01D59/44
代理机构 代理人
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