发明名称 Semiconductor device with clock failure detection circuitry
摘要 A semiconductor device is composed of an oscillator circuit developing a clock, and an oscillation failure detect unit. The an oscillation failure detect unit is configured to obtain at least one count value through counting clock pulses of the clock, and to activate an oscillation failure detect signal in response to the at least one count value being out of a predetermined count value range.
申请公布号 US2006149983(A1) 申请公布日期 2006.07.06
申请号 US20050302177 申请日期 2005.12.14
申请人 NEC ELECTRONICS CORPORATION 发明人 KONDOU TAKAO
分类号 G06F1/32;G06F1/26 主分类号 G06F1/32
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