发明名称 EDDY CURRENT PROBE, INSPECTING SYSTEM AND INSPECTING METHOD
摘要 PROBLEM TO BE SOLVED: To improve the signal-to-noise ratio, and to improve detection of defects of edge, in edge flaw detections for components. SOLUTION: An eddy current (EC) probe (12) for inspecting a component (16) is provided. The EC probe includes a drive coil (30), configured to generate a probing field for inducing eddy currents (18) in the component, where a portion of the eddy currents is aligned parallel to an edge (38) of the component. The EC probe further includes a pair of sensing coils (34, 35), where the axis (50) of the sensing coils is aligned perpendicular to the surface (14) of the component. The sensing coils are configured so as to sense the portion of the eddy currents, aligned parallel to the edge of the component. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006177952(A) 申请公布日期 2006.07.06
申请号 JP20050362697 申请日期 2005.12.16
申请人 GENERAL ELECTRIC CO <GE> 发明人 TOGO MOTTITO;WANG CHANGTING;PLOTNIKOV YURI A;MANDAYAM SHYAMSUNDER TONDANUR;MCKNIGHT WILLIAM S;BANTZ WALTER J;SUH UI WON
分类号 G01N27/90 主分类号 G01N27/90
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