发明名称 NONDESTRUCTIVE INSPECTION DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a small-sized nondestructive inspection device having high measurement accuracy. SOLUTION: A pulsed electron beam 22 is allowed to enter a target 18 by an electron accelerator 16, to thereby generate a bremsstrahlung X-ray, and an inspection object 10 is irradiated therewith. The X-ray 28 transmitted through the inspection object 10 is received by a scintillator 30, and generated light is converted into a corresponding electric signal 34 by a photodetector 32. The electric signal 34 is integrated during a period T when the pulsed electron beam is generated, or during a period T' in consideration of a signal delay of the detector. The integration is repeated relative to a plurality of pulses. Thus, the transmission quantity of the X-ray through the inspection object 10 is measured from the integrated value, and a shape characteristic of the inspection object 10 can be inspected. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006177841(A) 申请公布日期 2006.07.06
申请号 JP20040372756 申请日期 2004.12.24
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 SUZUKI RYOICHI
分类号 G01N23/02 主分类号 G01N23/02
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