发明名称 METHOD FOR MANUFACTURING RADIATION MEASUREMENT APPARATUS
摘要 PROBLEM TO BE SOLVED: To eliminate a stain of a crystal in a semiconductor material caused, by soldering a semiconductor detector to a print circuit board. SOLUTION: A method is provided which comprises applying a conductive adhesive to the surface of the semiconductor material (step 1); attaching an electrode plate to the surface of the semiconductor material (step 2); subjecting a semi-finished radiation measurement apparatus to a first thermal treatment, in order to harden the adhesive (step 3); disposing the semiconductor detector on the print circuit board (step 4); heating them in an electric furnace (step 5), i.e., carrying out second thermal treatment, whereby the semiconductor detector is soldered with conductors on the print circuit board; and heating the radiation measurement apparatus at 130°C in the electric furnace (step 6), i.e., carrying out a third thermal treatment, wherein its preferable temperature exceeds 80°C but is not higher than 170°C. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006177828(A) 申请公布日期 2006.07.06
申请号 JP20040372486 申请日期 2004.12.24
申请人 HITACHI LTD 发明人 KIYONO TOMOYUKI;YANAGIDA NORIFUMI;UENO YUICHIRO;AMAMIYA KENSUKE
分类号 G01T1/24;H01L31/09 主分类号 G01T1/24
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