In one aspect, the invention is an integrated circuit (IC) for use in testing a device. The IC includes a pin electronics (PE) driver having an output and a pin. The IC also includes a buffer connected to the output of the PE driver and the pin. The first voltage measured at the pin is greater than a second voltage measured at the output. The IC may include a first amplifier having an input connected to a voltage source. The IC may also include a second amplifier having an input connected to the output of the PE driver.
申请公布号
WO2006071668(A2)
申请公布日期
2006.07.06
申请号
WO2005US46332
申请日期
2005.12.16
申请人
TERADYNE, INC.;WALKER, ERNEST P.;SARTSCHEV, RONALD A.