发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device which isolates an n-well from n<SP>+</SP>buried layer to reduce chip size. SOLUTION: The semiconductor device comprises a plurality of low voltage n-well area 31 biased at different potentials and isolated from a substrate 1 by a common n<SP>+</SP>buried layer 11 and at least one high voltage n-well area 27. The low voltage n-well area 31 is coupled to the common subjacent n<SP>+</SP>buried layer 11 through a common p<SP>+</SP>buried layer 17. The n-well area 31 is applied to the substrate 1 usable in the semiconductor device, the n<SP>+</SP>buried layer 11 is formed in a designated low voltage area 5 of a negatively biased p-type semiconductor. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006179864(A) |
申请公布日期 |
2006.07.06 |
申请号 |
JP20050280013 |
申请日期 |
2005.09.27 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD |
发明人 |
SUNG TZU-CHIANG;HUANG CHIH PO;YEH RANN SHYAN;LIU JUN XIU;CHANG CHI-HSUEN;CHIN CHUGI |
分类号 |
H01L21/8238;H01L21/761;H01L21/8222;H01L27/082;H01L27/092 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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地址 |
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