| 摘要 |
PROBLEM TO BE SOLVED: To provide a device for inspecting a memory device capable of improving the inspecting efficiency of a memory device. SOLUTION: A test system for the memory device is provided with a tester 102 for applying a plurality of different redundancy tests on the memory device based on a plurality of different testing conditions. The test system is provided with a wafer test host 101. The tester 102 synthesizes the test results of a plurality of different tests to obtain a synthetic test result. The wafer test host 101 is provided with a repair device 103 for determing the treatment of the memory device based on the synthetic test result. The repair device 103 treats the memory device based on the determination result. COPYRIGHT: (C)2006,JPO&NCIPI
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