发明名称 |
Chemical vapor deposition chamber for depositing titanium silicon nitride films for forming phase change memories |
摘要 |
<p>Organometallic precursors may be utilized to form titanium silicon nitride films that act as heaters for phase change memories. By using a combination of TDMAT (tetrakis (dimethylamino) titanium) and TrDMASI (tris (dimethylamino) silane), for example in a metal organic chemical vapor deposition chamber (52), a relatively high percentage of silicon may be achieved in reasonable deposition times. Two separate bubblers (58a,58b) may be utilized to feed the two organometallic compounds in gaseous form to the deposition chamber (52) so that the relative proportions of the precursors can be readily controlled.</p> |
申请公布号 |
EP1676934(A1) |
申请公布日期 |
2006.07.05 |
申请号 |
EP20040107072 |
申请日期 |
2004.12.30 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
LEE, JONG-WON;HAMAMJY, ROGER |
分类号 |
C23C16/34;H01L45/00 |
主分类号 |
C23C16/34 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|