发明名称 IMAGE SENSOR WITH ENLARGED PHOTO DETECTING AREA AND METHOD FOR FABRICATION THEREOF
摘要 <p>A complementary metal oxide semiconductor (CMOS) device with a three dimensional integration structure and a method for fabricating the same are provided. An image sensor includes a first substrate in which a photo detection device is formed; a second substrate in which a peripheral circuit is formed, wherein the first substrate and the second substrate are bonded through a plurality of bonding pads formed on both the first substrate and the second substrate, and a back side of the first substrate is turned upside down; and a microlens formed on a top portion of the back side of the first substrate.</p>
申请公布号 KR20060077173(A) 申请公布日期 2006.07.05
申请号 KR20040115972 申请日期 2004.12.30
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 PARK, SANG KYUN
分类号 H01L27/146;H01L31/10 主分类号 H01L27/146
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