发明名称 Laser alignment target
摘要 A technique to form a structure with a rough topography in a planarized semiconductor process. The rough topography is formed by creating cored contacts. Subsequent process layers may be further stacked on top of the cored contacts in order to augment the nonplanar characteristics of the cored contacts. This rough topography structure may be used to align integrated circuits and wafers. An integrated circuit may be laser aligned using this alignment structure.
申请公布号 US7071104(B1) 申请公布日期 2006.07.04
申请号 US20030606670 申请日期 2003.06.25
申请人 ALTERA CORPORATION 发明人 MADURAWE RAMINDA U.
分类号 H01L21/44 主分类号 H01L21/44
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