发明名称 Reflection type mask
摘要 A reflection type mask includes a substrate on which a multi-layered film for reflecting X-rays is provided, a mask pattern which is formed on the multi-layered film for absorbing the X-rays, and a cover for protecting the mask pattern. The cover is detachably attached to the substrate.
申请公布号 US7072438(B2) 申请公布日期 2006.07.04
申请号 US20030736693 申请日期 2003.12.17
申请人 CANON KABUSHIKI KAISHA 发明人 CHIBA KEIKO;TSUKAMOTO MASAMI;WATANABE YUTAKA;HARA SHINICHI;MAEHARA HIROSHI
分类号 G21K3/00;G03F1/14;G21K5/00;H01L27/00 主分类号 G21K3/00
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