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发明名称
Verfahren und Schaltungsanordnung zum Ermitteln der Impedanz eines Messobjekts, insbesondere bei Hochfrequenz
摘要
申请公布号
DE1260618(B)
申请公布日期
1968.02.08
申请号
DE1963S086895
申请日期
1963.08.26
申请人
SIEMENS AKTIENGESELLSCHAFT
发明人
SCHLUETER DIPL.-ING. KLAUS
分类号
G01R27/02
主分类号
G01R27/02
代理机构
代理人
主权项
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