发明名称 |
Device and method for electronic device test |
摘要 |
A test device tests acceptability of a plurality of electronic devices formed on a wafer. The test device includes: a pattern supply part for supplying test patterns to each of the plurality of electronic devices; a power supply for applying power supply voltage to each of the plurality of electronic devices; a measurement part for measuring the data indicating the operations of each of the electronic devices generated by the test patterns; a calculation part for calculating the reference values for judging the acceptability of each of the electronic devices; and a judgment part for judging the acceptability of each of the electronic devices.
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申请公布号 |
US7071721(B2) |
申请公布日期 |
2006.07.04 |
申请号 |
US20030440754 |
申请日期 |
2003.05.19 |
申请人 |
ADVANTEST CORPORATION |
发明人 |
FURUKAWA YASUO |
分类号 |
G01R31/26;G01R31/28;G01R31/30;G01R31/3173;G01R31/3183;G01R31/3185;G01R31/319;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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