| 摘要 |
A METHOD OF JUDGING WHETHER AN ELECTRONIC COMPONENT IS GOOD OR DEFECTIVE IN ACCORDANCE WITH A RESPONSE OUTPUT SIGNAL BY INPUTTING A TEST SIGNAL TO THE IC TO BE TESTED,WHEREIN A COMMON TEST SIGNAL IS INPUT TO RESPECTIVE ELECTRONIC DEVICES A1 AND A2 OF A GROUP OF ELECTRONIC DEVICES COMPOSED OF A PLURALITY OF ELECTRONIC DEVICES, AND IN ACCORDANCE WITH A RESPONSE SIGNAL THEREOF, THE GROUP OF ELECTRONICDEVICES AS A WHOLE SUBJECTED TO THE TEST IS JUDGED TO BE GOOD OR DEFECTIVE. IN THE SECOND TEST, EACH OF THE DUTS A1 AND A2 OF THE GROUP OF ELECTRONIC DEVICES JUDGED TO BE DEFECTIVE IS INPUT A MUTUALLY INDEPENDENT TEST SIGNAL, AND IN ACCORDANCE WITH THE RESPONSE SIGNAL THEREOF, IT IS JUDGED WHETHER EACH WITH THE EACH OF THE ELECTRONIC DEVICES A1 AND A2 SUBJECTED TO THE TEST IS GOOD OR DEFECTIVE.
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