发明名称 CMP POLISHING PAD HAVING GROOVE PROVIDED TO IMPROVE POLISHING MEDIUM UTILIZATION
摘要 <P>PROBLEM TO BE SOLVED: To provide a chemical mechanical polishing (CMP) pad having a groove provided to improve polishing medium utilization, in particular, regarding a field of CMP in general. <P>SOLUTION: A polishing pad 104 has an annular polishing track 152 for polishing a wafer 120. In the wafer track 152, a plurality of grooves 112 are arranged so that they may be spaced one another both radially and circumferentially in relation to rotational nature of the pad 104 and be in at least partially non-circumferential direction in relation to the pad 104. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006167907(A) 申请公布日期 2006.06.29
申请号 JP20050360480 申请日期 2005.12.14
申请人 ROHM & HAAS ELECTRONIC MATERIALS CMP HOLDINGS INC 发明人 MULDOWNEY GREGORY P
分类号 B24B37/00;B24D99/00;H01L21/304 主分类号 B24B37/00
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