发明名称 METHOD AND APPARATUS FOR MEASURING OFFSET
摘要 PROBLEM TO BE SOLVED: To measure an offset among a plurality of recording layers in a multilayer type or double layer type information recording medium. SOLUTION: This method for measuring the offset is provided with a process for recording measurement information only in a prescribed section from a measurement reference position on a recording track of an L0 layer and recording the measurement information only in the same section as the prescribed section from a measurement corresponding position associated by a preformat address with the measurement reference position on a recording track of an L1 layer, a process for detecting a boundary of a first recorded area where the measurement information is recorded and a first unrecorded area on the recording track of the L0 layer based on the difference of reflectivity, a process for detecting a second boundary position on the recording track of the L1 layer based on the difference of the reflectivity, and a process for determining the offset based on the detected first and second boundary positions. Moreover, the method is provided with a process for determining whether a decided offset is within an allowable range with respect to the first offset set for an offset measurement in advance. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006172664(A) 申请公布日期 2006.06.29
申请号 JP20040366888 申请日期 2004.12.17
申请人 PIONEER ELECTRONIC CORP 发明人 TAGIRI TAKAO;OSHIMA KIYOAKI
分类号 G11B7/0045 主分类号 G11B7/0045
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