| 摘要 |
A semiconductor memory device has: a first memory including a data storage area and a redundant data storage area; a second memory as a nonvolatile memory storing a defect address of the first memory; a register; a sequencer; and a decoder. The sequencer reads out the defect address from the second memory and stores the read defect address in the register. When accessing a target address in the first memory, the decoder compares the target address with the defect address stored in the register, and selects any of the data storage area and the redundant data storage area of the first memory based on a result of the comparison.
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