发明名称 Semiconductor device connector, semiconductor device carrier, semiconductor device socket using the same and probe card
摘要 A semiconductor device carrier comprising; a carrier housing having a housing portion for accommodating a semiconductor device; an electrode sheet disposed in the carrier housing, having a front surface wiring conductively arranged on a front surface of an insulation substrate, a rear surface wiring conductively arranged on a rear surface of the insulation substrate, a rear surface bump contact placement wiring, and a bump contact disposed in a contact placement portion and an elastic sheet disposed in the carrier housing to be in contact with the bottom of the electrode sheet; wherein a width of the rear surface bump contact placement wiring in correspondence to a bump contact to be in contact with an extreme electrode section of the semiconductor device is smaller than a width of the front surface bump contact placement wiring on which a bump contact to be in contact with the extreme electrode section is arranged.
申请公布号 US2006138641(A1) 申请公布日期 2006.06.29
申请号 US20050315482 申请日期 2005.12.23
申请人 YAMAICHI ELECTRONICS CO., LTD. 发明人 SUZUKI TAKEYUKI
分类号 H01L23/12 主分类号 H01L23/12
代理机构 代理人
主权项
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