发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a charged particle beam device having high resolution, and a wide scanning region (observational visual field). SOLUTION: A means to adjust a focus, a means 45 to adjust astigmatism, a means to control and detect a scanning position, and a means to simultaneously control focus adjustment and astigmatism adjustment are provided, and achieving high resolution and securing a wide range of the observational visual field are made compatible. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006173035(A) 申请公布日期 2006.06.29
申请号 JP20040367153 申请日期 2004.12.20
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 SASAKI HIROKO;GUNJI YASUHIRO;TEI TOMOKI
分类号 H01J37/28;H01J37/153;H01J37/21 主分类号 H01J37/28
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