发明名称 Method for depositing titanium oxide layer and method for fabricating capacitor by using the same
摘要 Disclosed are a method for depositing a titanium oxide (TiO<SUB>2</SUB>) layer and a method for fabricating a capacitor by using the same. The method for forming the TiO<SUB>2 </SUB>layer includes the steps of: a) adsorbing titanium hydride (TiH<SUB>2</SUB>) on a wafer loaded into a chamber by supplying TiH<SUB>2 </SUB>to the chamber; b) purging out the non-adsorbed TiH<SUB>2</SUB>; c) forming an TiO<SUB>2 </SUB>layer on the wafer by inducing a reaction between the TiH<SUB>2 </SUB>and the oxygen source with supplying an oxygen source as a reaction gas to the chamber; and d) purging out the non-reacted oxygen source and a by-product. The method for fabricating the capacitor includes the steps of: forming a lower electrode on a wafer; depositing a titanium oxide (TiO<SUB>2</SUB>) layer on the lower electrode by using titanium hydride (TiH<SUB>2</SUB>) as a precursor; and forming an upper electrode on the TiO<SUB>2 </SUB>layer.
申请公布号 US2006141702(A1) 申请公布日期 2006.06.29
申请号 US20050150421 申请日期 2005.06.09
申请人 WOO HYUN-KYUNG;YEOM SEUNG-JIN;KIL DEOK-SIN;HONG KWON 发明人 WOO HYUN-KYUNG;YEOM SEUNG-JIN;KIL DEOK-SIN;HONG KWON
分类号 H01L21/8242;H01L21/20;H01L21/44 主分类号 H01L21/8242
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