发明名称 Lithographic apparatus, illumination system and method for mitigating debris particles
摘要 A lithographic apparatus includes a source for generating radiation bursts with a predetermined frequency, an illumination system for conditioning the radiation, a patterning device for patterning the radiation, and a projection system for projecting the patterned radiation onto a substrate. The illumination system includes a debris mitigating system for mitigating debris particles released with the generation of the radiation. The debris mitigating system is arranged to apply on the basis of the predetermined frequency a dynamically applicable condition to which the debris particles are exposed.
申请公布号 US2006138361(A1) 申请公布日期 2006.06.29
申请号 US20040020555 申请日期 2004.12.27
申请人 ASML NETHERLANDS B.V. 发明人 VAN HERPEN MAARTEN MARINUS JOHANNES W.
分类号 G01J3/10 主分类号 G01J3/10
代理机构 代理人
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