| 摘要 |
PROBLEM TO BE SOLVED: To verify the validity of an input pattern, and to detect faults in a test circuit itself, in the test circuit for inputting a serial test pattern. SOLUTION: The test circuit of a semiconductor integrated circuit device comprises a scan flip-flop circuit 10 for connecting a plurality of stages of flip-flops in series and supplies a serial test pattern inputted from the outside to a circuit to be tested; and a validity determining section 40 that is connected to the final stage of the scan flip-flop circuit in series and checks the validity of the inputted serial test pattern. The validity determining section includes a first check value setting circuit 20a for outputting the check result of validity in the serial input direction of the serial test pattern; and a second check value installation circuit 20b for outputting the check value of validity, in the direction of the time of the serial test pattern. COPYRIGHT: (C)2006,JPO&NCIPI
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